Surface form analysis

A profile is
the starting point.

Asphera Analyzer compares a measured profile with a nominal aspheric surface and helps show how the form error takes shape.

Explore the analysis
Every analysis starts from a measured .PRF profile
Asphera logo A / 01 FORM · MEASUREMENT · ANALYSIS
Asphera Analyzer showing a loaded profile, Form Error (Radius Optimised), surface settings, and Best Fit Radius results.
Loaded profile · Form Error (Radius Optimised) · Best Fit Radius

Surface Form Analysis

Compare measured form
with its model.

Load a .PRF profile with its surface design, then inspect the residual and PV/RMS metrics. Best Fit Radius evaluates the residual across a configured radius range.

ASPHERIC DESIGN

Set radius, conic constant, clear aperture, orientation, and supported asphere coefficients in the nominal surface model.

.PRF measurement R · K · Aₙ nominal surface PV · RMS form residual
Asphera Analyzer showing a measured form profile with detected diffraction zones and the zone analysis tab.
Diffraction Analysis · detected zones and half-diameter comparison

02 / Zone analysis

Diffraction
Analysis

Load a .diff configuration and analyse transitions against the measured profile. The zone view marks the detected bands and reports nominal-to-measured half-diameter differences.

CONFIGURATION.diff parameters and coefficients
READOUTDetected zones · Δ half-diameter
Asphera Analyzer with the Error Compensation view, profile residual, excluded ranges, and compensation results.
Error Compensation · residual, excluded ranges, and fit result

03 / Residual fitting

Error
Compensation

Fit X offset and tilt, then review the compensation result against the measured residual. Excluded ranges remain visible in the plot and are omitted from applicable metrics.

FITTED TERMSX offset · tilt
EXCLUDED AREASSelected ranges · retained in profile context

Processing tools

Profile
processing.

Filter, reconstruct, and fit the profile while keeping raw measurements and the ordinary Form Error available as distinct states.

01 / LOCAL EVENTS

Spike Removal

Detect narrow events by width and noise threshold. Reconstructed and unresolved events remain distinguishable in the processed profile.

02 / SPATIAL FILTER

Lambda‑S

Apply an optional Gaussian filter with a configurable cutoff length. Inspect the filtered state and its metrics separately.

03 / FORM FIT

Error Compensation

Fit X offset and tilt, then compare the starting and optimised residuals.

Best Fit RadiusSearch a configured radius range using RMS.
Excluded AreasExclude selected ranges from applicable metrics while keeping their profile context visible.
Profile statesRaw · aligned · residual · modified

Analysis outputs

Export analysis
results.

CSVRaw · Aligned · Residual · Modified profiles
MODModified Profile output
PDFAnalysis report, including diffraction results when available
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